GEIA - Government Electronics & Information Technology Association

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| EIA-554 |
| Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM) |
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EIA-554 - Assessment of Average Outgoing Quality Levels in Parts Per Million
INTRODUCTION
Improvements in manufacturing technology and methodology have resulted in corresponding quality improvements for electronic components. As a result, the traditional measure for reporting average quality levels in percent nonconforming needs to be replaced with a quantity more in line with the quality levels of today. That measure is parts per million or PPM. It is simply clearer to report estimated average component quality as 1.0 PPM, rather than the more cumbersome 0.001 %. In this standard, the PPM terminology applies to estimating the Average Outgoing Quality (AOQ) level of a component, from lot acceptance results.
This standard was developed to provide a uniform method of measurement and calculation of average outgoing quality levels. Minimum sample sizes and a method for aggregating data are provided.
SCOPE
This standard is intended to provide a uniform method of calculating an estimate of the proportion nonconforming in finished components and to provide a standardized definition of the quality index referred to as Average Outgoing Quality (AOQ). The method used here is primarily directed at components whose production or procured volume is large enough, during some predefined sampling period, to give statistically meaningful information.
APPLICATION
This standard is intended to provide a method for the estimation and reporting of proportion nonconforming. The AOQ philosophy applies to the estimation of the average quality level of a product, not to lot acceptance plans. Since it is necessary to focus on accumulated lots to generate sufficient data for component quality characterization, the method in this standard should not be used to establish PPM levels for individual lots or to form the basis for determining acceptability of product on a lot-by-lot or batch-by-batch basis.