SEMI G59 TEST METHOD FOR MEASUREMENT OF IONIC CONTAMINATION ON LEADFRAME INTERLEAFING AND THE CONTAMINATION TRANSFERRED FROM THE INTERLEAFING TO THE LEADFRAMES

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SEMI G59 Document Information:

Title
TEST METHOD FOR MEASUREMENT OF IONIC CONTAMINATION ON LEADFRAME INTERLEAFING AND THE CONTAMINATION TRANSFERRED FROM THE INTERLEAFING TO THE LEADFRAMES

Semiconductor Equipment and Materials International

Publication Date:
Jan 1, 1994

Scope:

This test method is sensitive to the following ionic species: Na⁺, NH₄ ⁺, K⁺, Cl^-, NO₃ ^-, Br^-, SO₄^2-, PO₄^3-.

This standard does not purport to address safety issues, if any, associated with its use. It is the responsibility of the users of this standard to establish appropriate safety health practices and determine the applicability or regulatory limitations prior to use.

Purpose

This test method describes a procedure to determine the ionic contamination on leadframe interleafing and the contamination transferred from the interleafing to the leadframes using a water extraction method.

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