EIA SP4981 Temperature Rise Versus Current Test Procedure for Electrical Connectors and Sockets
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EIA SP4981 Document Information:
Title
Temperature Rise Versus Current Test Procedure for Electrical Connectors and Sockets
Electronic Industries Alliance
Publication Date:
Sep 28, 2001
Scope:
This procedure establishes the test procedures for determining temperature rise versus current for connectors and sockets with conductor sizes equal to or less than 0000 AWG or equivalent.
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