SEMI D35 TEST METHOD FOR MEASUREMENT OF COLD CATHODE FLUORESCENT LAMP (CCFL) CHARACTERISTICS
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SEMI D35 Document Information:
Title
TEST METHOD FOR MEASUREMENT OF COLD CATHODE FLUORESCENT LAMP (CCFL) CHARACTERISTICS
Semiconductor Equipment and Materials International
Publication Date:
Nov 1, 2003
Scope:
This method is to be used by CCFL suppliers and users to
evaluate quality of products as well as items under
development.
This method shall be used in general for CCFL to measure the
initial characteristics of CCFL (single item) and its reliability
after tests, and to carry out quality inspection for incoming and
outgoing CCFLs.
NOTICE: This standard does not purport to
address safety issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine the
applicability of regulatory or other limitations prior to use.
Purpose
The purpose of this document is to standardize the method for
measurement of electrical and optical characteristics of cold
cathode fluorescent lamp (CCFL).
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