SEMI E43 RECOMMENDED PRACTICE FOR ELECTROSTATIC MEASUREMENTS ON OBJECTS AND SURFACES
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SEMI E43 Document Information:
Title
RECOMMENDED PRACTICE FOR ELECTROSTATIC MEASUREMENTS ON OBJECTS AND SURFACES
Semiconductor Equipment and Materials International
Publication Date:
Nov 1, 2008
Scope:
The measurement methods described herein can be applied to
characterize the general electrostatic charge, voltage, field
level(s) and electrostatic discharge on objects and surfaces in
semiconductor manufacturing environments. Acceptable equipment,
calibration, and measurement techniques are described in this
document. Appendices include background information on the
equipment specified and calibration procedures, as well as
information and advice on performing a useful general static
survey.
NOTICE: This standard does not purport to
address safety issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine the
applicability of regulatory or other limitations prior to use.
Purpose
The purpose is to establish a practice for reproducible
electrostatic measurements on any surface or object, consistent
with the scope and limitations set forth below.
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