TIA TIA-455-8 FOTP-8 Measurement of Splice or Connector Loss and Reflectance Using an OTDR
 |
| Purchase Information |
| Use this form to request purchase information on TIA online subscriptions. |
|
 |
Document TIA TIA-455-8 is offered by IHS as part of an online subscription. This subscription contains many documents on the same topic.
You may also purchase this document alone from the IHS Standards Store.
TIA TIA-455-8 Document Information:
Title
FOTP-8 Measurement of Splice or Connector Loss and Reflectance Using an OTDR
Telecommunications Industry Association
Publication Date:
Apr 25, 2000
Scope:
Introduction
Intent
This procedure describes the use of an optical time-domain
reflectometer (OTDR) to indirectly measure the loss and reflectance
of a splice or connector.
Other methods
Loss or reflectance measurements may be obtained also by using
FOTP-34 or FOTP-107. The latter values will be accepted as correct
in the event of a dispute.
Trace defects
Some OTDR/fiber combinations appear to give "noisy" traces that
may be repeatable for a given OTDR but not against other OTDRs with
the same fiber. These appear to be related to polarization and
coherence effects, and are being studied in FO-6.6. Some OTDR
manufacturers offer noise filters, internal or external to the
OTDR, and care shall be taken that these do not mask "true"
artifacts of the trace. Moreover, parts of the trace that are noisy
due to low signal-to-noise ratio shall not be used.
Keywords:
- splice
- connector
- reflectance
- OTDR
About IHS
IHS (NYSE: IHS) is a leading global provider of critical technical information, decision-support tools and related services in a number of industries including aerospace and defense, automotive, construction, electronics, and energy. IHS serves customers ranging from large governments and multinational corporations to smaller companies and technical professionals in more than 100 countries. IHS been in business for more than 45 years and employ more than 2,300 people around the world.