SEMI G23 TEST METHOD FOR INDUCTANCE OF INTERNAL TRACES OF SEMICONDUCTOR PACKAGES
 |
| Purchase Information |
| Use this form to request purchase information on SEMI online subscriptions. |
|
|
Document SEMI G23 is offered by IHS as part of an online subscription. This subscription contains many documents on the same topic.
You may also purchase this document alone from the IHS Standards Store.
SEMI G23 Document Information:
Title
TEST METHOD FOR INDUCTANCE OF INTERNAL TRACES OF SEMICONDUCTOR PACKAGES
Semiconductor Equipment and Materials International
Publication Date:
Sep 1, 1996
Scope:
This test method is applicable for the measurement of package
inductance that is greater than 0.5 nH.
This document describes the measurement of a pin grid array, one
of the package types, as a sample.
This test method is also applic able to other types of
packages.
The inductance in this document is limited to that of internal
traces only and does not contain the portions contributed by the
exposed areas such as pins and wires.
This document uses SI units.
Purpose
This test method describes the measurement method for the
inductance of internal traces of semiconductor packages.
About IHS
IHS (NYSE: IHS) is a leading global provider of critical technical information, decision-support tools and related services in a number of industries including aerospace and defense, automotive, construction, electronics, and energy. IHS serves customers ranging from large governments and multinational corporations to smaller companies and technical professionals in more than 100 countries. IHS been in business for more than 45 years and employ more than 2,300 people around the world.
