SEMI G60 TEST METHOD FOR THE MEASUREMENT OF ELECTROSTATIC PROPERTIES OF SEMICONDUCTOR LEADFRAME INTERLEAFING MATERIALS

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SEMI G60 Document Information:

Title
TEST METHOD FOR THE MEASUREMENT OF ELECTROSTATIC PROPERTIES OF SEMICONDUCTOR LEADFRAME INTERLEAFING MATERIALS

Semiconductor Equipment and Materials International

Publication Date:
Jan 1, 1994

Scope:

This test method is suitable for all interleaf materials and may be used by vendors at outgoing inspection, or customers at incoming inspection.

This standard does not purport to address safety issues, if any, associated with its use. It is the responsibility of the users of this standard to establish appropriate safety health practices and determine the applicability or regulatory limitations prior to use.

Purpose

This test method describes a procedure to determine the electrostatic properties of interleaf materials in film or sheet form by measuring the magnitude and polarity of an induced charge and the time required for complete dissipation of the charge.

NOTE 1: The method is independent of volume or insulation resistivities.

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