SEMI G66 TEST METHOD FOR THE MEASUREMENT OF WATER ABSORPTION CHARACTERISTICS FOR SEMICONDUCTOR PLASTIC MOLDING COMPOUNDS
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SEMI G66 Document Information:
Title
TEST METHOD FOR THE MEASUREMENT OF WATER ABSORPTION CHARACTERISTICS FOR SEMICONDUCTOR PLASTIC MOLDING COMPOUNDS
Semiconductor Equipment and Materials International
Publication Date:
Jan 1, 1996
Scope:
This method may be applied to all semiconductor plastic molding
compounds.
This method may be used to characterize molding compounds in
development.
Packaging engineers may simulate the water absorption
characteristics and their significance in relation to package
cracks at soldering by using calculated diffusion and solubility
coefficients.
NOTICE: This standard does not purport to
address safety issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine the
applicability of regulatory or other limitations prior to use.
Purpose
This method describes a procedure for measuring the water
absorption rate for plastic molding compounds and provides a method
to calculate the diffusion and solubility coefficients, which are
required to simulate the water absorption characteristics.
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