ECA EIA-364-25C TP-25C Probe Damage Test Procedure for Electrical Connectors

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ECA EIA-364-25C Document Information:

Title
TP-25C Probe Damage Test Procedure for Electrical Connectors

Electronic Components, Assemblies & Materials Association

Publication Date:
May 1, 1998

Scope:

This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. The purpose of this test is to simulate a form of field abuse of contacts during test by inserting probes into connector socket contacts.

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