IEEE 300 Standard Test Procedures for Semiconductor Charged-Particle Detectors
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IEEE 300 Document Information:
Title
Standard Test Procedures for Semiconductor Charged-Particle Detectors
The Institute of Electrical and Electronics Engineers, Inc.
Publication Date:
Jun 9, 1988
Scope:
Foreword
This standard provides standard test procedures for semiconductor charged-particle detectors for ionizing radiation. It supersedes the previous edition, ANSI/IEEE Std 300-1982. The standard has been modified and refined based on the experience gained in using the earlier edition over a number of years, taking into account advances in the technology. Companion documents are ANSI/IEEE Std 301-1988, Test Procedures for Amplifiers and Preamplifiers Used with Detectors of Ionizing Radiation, and ANSI/ IEEE Std 759-1984, IEEE Standard Test Procedures for Semiconductor X-ray Energy Spectrometers.
Scope
This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the m ethods are too complex or require equipment (such as particle accelerators) which may not be readily available.
Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988 [2].1
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