IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture

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IEEE 1149.1 Document Information:

Title
Standard Test Access Port and Boundary-Scan Architecture

The Institute of Electrical and Electronics Engineers, Inc.

Publication Date:
Jun 14, 2001

Scope:

This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to

— testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate;

— testing the integrated circuit itself; and

— observing or modifying circuit activity during the component’s normal operation.

The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).

Keywords:

circuit boards

boundary scan

TAP

test

circuitry

VHDL

VHSIC Hardware Description Language

BSDL

printed circuit boards

Boundary-Scan Description Language

test access port

boundary-scan architecture

integrated circuit

boundary-scan register

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