SEMI M4 SPECIFICATIONS FOR SOS EPITAXIAL WAFERS
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SEMI M4 Document Information:
Title
SPECIFICATIONS FOR SOS EPITAXIAL WAFERS
Semiconductor Equipment and Materials International
Publication Date:
Nov 1, 2003
Scope:
The primary standardized properties set forth in this
specification relate to physical, dimensional, and electrical
characteristics of SOS epitaxial wafers.
NOTICE: This standard does not purport to
address safety issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine the
applicability of regulatory or other limitations prior to use.
Purpose
These specifications cover requirements for monocrystalline
silicon epitaxial layers on sapphire substrates, used for
semiconductor device manufacture. The combination of a silicon
epitaxial layer on a sapphire substrate is known as a silicon on
sapphire (SOS) epitaxial wafer. By outlining an inspection process
and defining various reject criteria, both suppliers and purchasers
can uniformly define epitaxial layer quality.
The defects discussed originate from two sources: those which
are caused by imperfection in the sapphire substrate and those
related to the epitaxial layer, including handling and
packaging.
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