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Document SEMI D34 is offered by IHS as part of an online subscription. This subscription contains many documents on the same topic.
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SEMI D34 Document Information:
Title
TEST METHOD FOR MEASUREMENT OF FPD POLARIZING FILMS
Semiconductor Equipment and Materials International
Publication Date:
Jul 1, 2003
Scope:
This document specifies measurement methods.
Specifies measurement methods for visual appearance (dot
defects, line defects, visual exclusion area), thickness, optical
characteristics (single transmittance, parallel transmittance,
cross transmittance, UV cut performance, polarization efficiency,
hue a, b and hue a*, b* and haze) of polarizing films.
NOTICE: This standard does not purport to
address safety issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine the
applicability of regulatory or other limitations prior to use.
Purpose
This standard establishes implementation guidelines for the
measurement of visual appearance, thickness, and optical
characteristics of FPD Polarizing Films. These methods can be
applied in manufacturing, quality control, and research and
development.
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