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IEEE 101 Document Information:
Title
Guide for the Statistical Analysis of Thermal Life Test Data
The Institute of Electrical and Electronics Engineers, Inc.
Publication Date:
Sep 10, 1987
Scope:
Foreword
(This Foreword is not a part of ANSI/IEEE Std 101-1987, IEEE Guide for the Statistical Analysis of Thermal Life Test Data.)
ANSI/IEEE Std 101-1987 is substantially revised from IEEE Std 101-1972. Extensive revision was deemed necessary to reflect the widespread access of users of this document to advanced calculators and computers. Thus the tedious workbook approach used in previous versions was no longer necessary. However, Annex 3 of this document does contain a detailed worked example to provide guidance to those individuals without advanced calculators or computers.
This document was prepared by the Statistics Technical Committee of the IEEE Dielectrics and Electrical Insulation Society. The members of the working group were as follows:
G. C. Stone , Chair
T. W. Dakin , Past Chair
P. E. Alexander
A. Bulinski
T. Claussen
E. M. Fort
J. Fothergill
H. N. Galpern
J. F. Lawless
W. B. Nelson
H. Rosen
G. A. Vincent
B. E. Ward
The members of the balloting committee that approved this document for submission to the IEEE Standards Board were as follows:
P. E. Alexander
A. Bulinski
T. Claussen
T. W. Dakin
E. M. Fort
J. Fothergill
H. N. Galpern
J. F. Lawless
W. B. Nelson
H. Rosen
G. C. Stone
G. A. Vincent
B. E. Ward
When the IEEE Standards Board approved this standard on September 10, 1987, it had the following membership:
Donald C. Fleckenstein , Chair
Marco W. Migliaro , Vice Chair
Andrew G. Salem , Secretary
James H. Beall
Dennis Bodson
Marshall L. Cain
James M. Daly
Stephen R. Dillon
Eugene P. Fogarty
Jay Forster
Kenneth D. Hendrix
Irvin N. Howell
Leslie R. Kerr
Jack Kinn
Irving Kolodny
Joseph L. Koepfinger*
Edward Lohse
John May
Lawrence V. McCall
L. Bruce McClung
Donald T. Michael*
L. John Rankine
John P. Riganati
Gary S. Robinson
Frank L. Rose
Robert E. Rountree
William R. Tackaberry
William B. Wilkens
Helen M. Wood
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