SEMI G55 TEST METHOD FOR MEASUREMENT OF SILVER PLATING BRIGHTNESS

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SEMI G55 Document Information:

Title
TEST METHOD FOR MEASUREMENT OF SILVER PLATING BRIGHTNESS

Semiconductor Equipment and Materials International

Publication Date:
Jan 1, 1993

Scope:

This method describes the standard method for measuring the brightness of silver plating on semiconductor leadframes.

NOTE 1: This method determines quantitative measures which are not related directly to the traditional "Dull," "Semi-Bright" and "Bright" descriptors for silver plating.

NOTICE: This standard does not purport to address safety issues, if any, associated with its use. It is the responsibility of the users of this standard to establish appropriate safety and health practices and determine the applicability of regulatory or other limitations prior to use.

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