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SEMI E35 Document Information:
Title
GUIDE TO CALCULATE COST OF OWNERSHIP (COO) METRICS FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT
Semiconductor Equipment and Materials International
Publication Date:
Mar 1, 2007
Scope:
This guide is applicable to any type of equipment for processing
semiconductor units, which may be wafers, devices, flat panels, or
other material. Some terms are specialized to integrated circuit
wafer and device production.
Effective use of the metric to build a COO model requires
identification of constraints and data values. Where possible, use
direct values for inputs rather than deriving them from secondary
models or using example values.
NOTE 2: Related Information 2 provides some example data.
Full calculation of COO often requires data held proprietary and
is coupled to the overall factory yield and the related cost of
yield loss. It is envisioned that this guide will be used for
internal factory and equipment optimization, investment evaluation,
and equipment design improvements.
NOTICE: This standard does not purport to
address safety issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine the
applicability of regulatory or other limitations prior to use.
Purpose
The purpose of this guide is to provide standard metrics for
evaluating unit production cost effectiveness of manufacturing
equipment in the semiconductor industry.
This guide establishes a procedure to facilitate an
understanding of equipment-related costs, including costs related
to environmental, health and safety (EHS) factors, by providing
definitions, classifications, algorithms, methods, and default
values necessary to build a comprehensive, constrained, or monitor
cost of ownership (COO) calculator.
NOTE 1: Related Information 1 provides a graphical
representation of calculating COO to expand upon the guide
text.
About IHS
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