IHS Inc. The Source for Critical Information and Insight
Electronics |  Change

Advanced Search
 
 

IEEE Begins Work on First Circuit Probe Test Standard

July 8, 2006

 
IHS Sells IEEE Documents
IHS is a leading provider of online access to large document collections from IEEE. For more information and a price quote, please complete the form below.
IEEE Applications
IEEE Communications
IEEE Computers & Electronics
IEEE Instruments & Terminology
IEEE Power
First Name:

Last Name:

Email address:
The Institute of Electrical and Electronics Engineers Inc. (IEEE) is developing the first standard defining a uniform method for characterizing electrical circuit probe performance. IEEE also approved revised versions of five power generation standards, including a generating station design guide, two standards for nuclear power stations and a standard for wire and cable flame testing.

IEEE P1696 - Standard for Terminology and Test Methods for Circuit Probes will address electrical circuit probes and probes systems, including waveform acquisition hardware and software and signal/waveform analysis software. This document will apply to probes having either signal and ground conductors or two-signal conductors. It will replace the proprietary methods that now exist at different vendors, so users can compare performance and understand probe circuit-loading effects.

The IEEE also approved revisions to five existing power generation standards:

The IEEE also reaffirmed the continued use of four standards:

Source: Institute of Electrical and Electronics Engineers Inc. (IEEE).

ELECTRONICS & TELECOM ENGINEERING STANDARDS NEWS
August 25, 2008
ABI: Industrial Precision GPS Solutions Experiencing Sustained Growth Levels
While much of the current attention surrounding global positioning system (GPS) technology is focused on consumer navigation and location-based ... more
August 22, 2008
Microsoft GFS Earns ISO/IEC 27001:2005 Certification
BSI Management Systems America announced that Microsoft Global Foundation Services (GFS) achieved certification to the international information ... more
August 18, 2008
NIST Model Predicts Network Security
Data breaches are a recurring problem for IT managers responsible for securing their company’s confidential data, as well as sensitive information ... more
August 18, 2008
Frost: Standardization, Technology Optimization Trigger Growth in Asia-Pacific RFID Inlays Market
The market for radio frequency identification (RFID) tags is set to see considerable growth, according to Frost & Sullivan, gaining traction ... more
August 18, 2008
Frost: Tech Innovations, Gov't Regs Drive Border Control Biometrics Use
The post-9/11 effort to clamp down on fraudulent activities and illegal immigration greatly increased the use of biometrics' usage in border ... more
Show All..