IEEE Approves Two Trial-Use Standards for XML - IEEE 1671.3, 1671.4
February 14, 2008 // Published as a news service by IHS
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The Institute of Electrical and Electronics Engineers (IEEE) approved two standards related to using standard Automatic Test Markup Language (ATML) for exchanging automatic test information via eXtensible Markup Language (XML).
IEEE 1671.3 - Trial-Use Standard Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit-Under-Test) Description Information specifies an exchange format using XML for identifying all of the hardware, software and documentation associated with a UUT.
This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS).
The standard will help to promote and facilitate interoperability between components of test and maintenance support systems by defining a common set of identification information for UUTs, said the IEEE.
IEEE 1671.4 - Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Configuration Information defines an exchange format using XML for identifying all of the hardware, software and documentation that may be used to test and diagnose a UUT on an ATS.
Test configuration provides a framework, which enables test program set data to be exchanged between compliant systems. The data supports the acquisition and itemization of test assets required to be in place prior to testing a UUT on the test system, said the IEEE.
Source: Institute of Electrical and Electronics Engineers Standards Association (IEEE-SA).