IEEE Approves On-Chip Scan Compression Standard - IEEE 1450.6.1
August 7, 2009 // Published as a news service by IHS
The Institute of Electrical and Electronics Engineers (IEEE) approved IEEE 1450.6.1 - Standard for Describing On-Chip Scan Compression.
This standard for integrated circuit (IC) test is also known as the open compression interface (OCI). It was initially created within the Accellera standards-setting organization and was transferred to the IEEE following Accellera's ratification.
OCI defines how information is passed from scan insertion to pattern generation and from pattern generation to diagnosis, allowing tools from different vendors to be used regardless of what on-chip scan compression logic is used.
It describes on-chip scan compression structures, operation and connectivity, which promote electronic design automation tool interoperability for pattern generation and diagnosis.
"The approval of IEEE 1450.6.1 opens up opportunities for chip manufacturers, design automation and the makers of automated test equipment," said Bruce D. Cory, chair for the IEEE working group which shepherded the standard.
"After on-chip scan compression was developed, each vendor had their own, different set of methods to pass necessary information from scan insertion to pattern generation and from pattern generation to diagnosis. This created significant competitive barriers. Now this standard allows the test industry to use a variety of tools, regardless of what on-chip scan compression logic was used," he said.
"Electronic design industry participants worked together as part of our Accellera Technical Subcommittee to improve design and test tool interoperability and to develop and achieve approval for our newest IEEE standard, IEEE 1450.6.1, which helps improve and reduce the costs of on-chip testability and manufacturing," said Shrenik Mehta, Accellera chair.
"The new standard helps make it possible to test silicon even if an IC design or its embedded intellectual property was developed using different design and test software," Mehta said.
IEEE 1450.6.1 was sponsored by the Test Technology Committee of the IEEE Computer Society.
Source: Institute of Electrical and Electronics Engineers Standards Association (IEEE-SA).