IEEE 1650 Revision Captures Low-Level Measurement Techniques for Carbon Nanotubes
March 5, 2009 // Published as a news service by IHS
The Institute of Electrical and Electronics Engineers (IEEE) will revise IEEE 1650 - Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes.
This project will revise the existing standard to capture current low-level measurement techniques applicable to carbon nanotube characterization.
The standard will be developed by the IEEE Nanotechnology Working Group and is sponsored by the IEEE Nanotechnology Council Standards Committee.
The measurement of carbon nanotubes requires knowledge of low-level electrical measurement techniques, which is sometimes not fully understood by nanotechnology specialists, according to IEEE.
Source: Institute of Electrical and Electronics Engineers (IEEE).