CISC Semiconductor Introduces RFID Tag Measurement, Evaluation Test System
August 20, 2007 // Published as a news service by IHS
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National Instruments (NI) asked CISC Semiconductor Design+Consulting GmbH to design a radio frequency identification (RFID) transponder performance test library using NI's Laboratory Virtual Instrumentation Engineering Workbench (LabVIEW) programming language.
An issue raised by putting an RFID project to work is to choose a suitable, application specific RFID transponder, said CISC, which developed an RFID Measurement & Evaluation Test System (MeETS) based on NI's LabVIEW to measure transponder characteristics and performance.
MeETS is designed to provide tests and evaluation for RFID transponder read-range, orientation, performance and frequency range, said CISC.
By 2010, 33 billion RFID transponders will be manufactured, according to a January 2006 report by In-Stat. The RFID industry grew exponentially since its first year and is expected to experience continued growth.
Currently, there are a number of transponder offers, designs and different manufacturers. The number of RFID applications and usage occasions is expected to increase as well, said CISC.
Certain substances like metals, liquids and plastics either reflect, detune or absorb the required electromagnetic field.
According to CISC, there are three steps to follow to gain the best read rate out of an RFID transponder:
- First, the suitable transponder type must be defined.
- Second, the right positioning or orientation of how to affix the transponder on the object is determined.
- Third, the RFID setup, like the portal has to work well together.
Two out of these three steps are addressed with the CISC RFID MeETS, according to CISC.
The measurement system supports RFID transponder orientation definition, transponder evaluation at various frequency ranges (important if a transponder should be read worldwide in an open system) and tests for defining the read-range of different transponders.
The CISC RFID MeETS is available in three different extension stages: The first level includes the CISC RFID MeETS Library for LabVIEW. The second level comprises the CISC RFID MeETS configured NI PXI hardware. The full system installation of software and hardware is recommended for laboratories and research or test centers, said CISC.
The CISC RFID MeETS was developed according to International Organization for Standardization (ISO) ratifications and EPCglobal recommendations, said CISC.
Source: CISC Semiconductor Design+Consulting Gmbh.